Improvement of Board Level Reliability for μBGA Solder Joints Using Underfill

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Improvement of Board Level Reliability for BGA Solder Joints Using Underfill

The underfilling BGA as an alternative to direct chip attachment for high density packaging technologies have been developed. This paper discusses the thermomechanical and metallurgical effects of underfill material and the resulting improvement in board level reliability for underfilled BGA assemblies. Finite element analysis (FEA) models were developed to predict the thermal fatigue life of t...

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ژورنال

عنوان ژورنال: MATERIALS TRANSACTIONS

سال: 2003

ISSN: 1345-9678,1347-5320

DOI: 10.2320/matertrans.44.2175